Thermal Property Measurement System : Seebeck Coefficient / Electric Resistance Measurement System ZEM-5 series
New series featured the properties evaluation for various kinds of thermoelectric materials
The ZEM-5 models are systems which feature special specifications such as high temperature, high resistance and thin film etc for various kinds of materials.
The system conforms to JIS standard for Seebeck coefficient measuring systems for thermoelectric materials.
(Thermoelectric power JIS R 1650-1 / Electric resistance JIS R 1650-2
Applications
Thermoelectric characteristic evaluation of a wide range of materials such as semiconductors, ceramics, and metals
Features
• Ohmic contact automatic check function (V-I plot) as a standard function
• The most suitable evaluation for Si series materials (SiGe, MgSi etc) with C type thermocouple as a temperature detecting sensor (HT type)
• The measurement up to 1200°C at the maximum (HT type)
• Available to measure a high resistance sample up to 10MΩ at the maximum (HR type)
• Available to measure a thin film material deposited on an insulated substrate (TF type)
• Available to measure in low temperature range (-150 ~ 200°C) (LT type)
ZEM-5HT: High temperature type
ZEM-5HR: High resistance type
ZEM-5LT: Low and Middle temperature type
ZEM-5TF: Thin film type
Specifications
Model |
ZEM-5HT |
ZEM-5HR |
ZEM-5LT |
ZEM-5TF |
Temperature range |
100 ~ 1200 °C |
50 ~ 800 °C |
-150 ~ 200 °C |
50 ~ 500 °C |
Sample size |
□ 2 ~ 4 or 4 × L 3 ~ 15 (mm) |
Substrate of deposition W 2 ~ 4 × t 0.4 ~ 1.2 × L 20 (mm) Thin film thickness nano meter order or more *Insulation layer to be required between sample film and substrate |
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Measurement atmosphere |
Low pressure helium gas |