Thermal Property Measurement System : Electric Resistance Measurement System for Metals and Semiconductors TER series

Metallic phase transition, aging, recrystallization reaction
This system can measure precisely the electric resistance of metallic alloys and semiconductors with DC four-thermal method.

Applications
• Research of metallic phase transition, aging and recrystallization
• Recrystallization analysis of amorphous metals
• Research and development of shape- memory alloys
• Measurement of temperature versus electrical resistance of semiconductor materials

Features
• Capable of measuring electric resistance in a constant-rate rising and falling temperature state and in a constant temperature state
• Capable of precise measurement with DC four-terminal method
• Free from influence of thermal electromotive forces

Specifications