Thermal Property Measurement System : 2-Omega Method Nano Thin Film Thermal conductivity Meter TCN-2ω

Thermal conductivity evaluation for a nano thin film at normal direction
TCN-2ω is the world’s only system which can measure thermal conductivity for a nano thin film at normal direction.

Applications
• Best suited for evaluation of thermal conductivity of thin film required for thermal design. Low-K insulating film, Organic thin film, Thin film of thermoelectric materials
• Development on an insulating film and improvement of its heat dissipation
• Application evaluation to thermoelectric thin films

Features
• Available to measure thermal conductivity of thin film (20 ～ 1000nm thickness) deposited on a substrate (Patent no. 5426115)
• Actualize the measurement of detecting temperature change by thermo-reflectance method
• Simply pre-treated for a sample

Specifications